{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:17:58Z","timestamp":1729621078789,"version":"3.28.0"},"reference-count":3,"publisher":"IEEE Comput. Soc. Press","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/edtc.1995.470331","type":"proceedings-article","created":{"date-parts":[[2002,11,19]],"date-time":"2002-11-19T12:10:21Z","timestamp":1037707821000},"page":"598","source":"Crossref","is-referenced-by-count":5,"title":["SENSAT-a practical tool for estimation of the IC layout sensitivity to spot defects"],"prefix":"10.1109","author":[{"given":"W.","family":"Pleskacz","sequence":"first","affiliation":[]},{"given":"W.","family":"Kuzmicz","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/4.192046"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"166","DOI":"10.1109\/TCAD.1985.1270112","article-title":"Modeling of Lithography Related Yield Losses for CAD of VLSI Circuits","volume":"cad 4","author":"maly","year":"1985","journal-title":"IEEE Trans Computer-Aided Design"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1985.1052403"}],"event":{"name":"the European Design and Test Conference. ED&TC 1995","acronym":"EDTC-95","location":"Paris, France"},"container-title":["Proceedings the European Design and Test Conference. ED&TC 1995"],"original-title":[],"link":[{"URL":"https:\/\/summer-heart-0930.chufeiyun1688.workers.dev:443\/http\/xplorestaging.ieee.org\/ielx2\/3300\/9922\/00470331.pdf?arnumber=470331","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T11:03:13Z","timestamp":1497524593000},"score":1,"resource":{"primary":{"URL":"https:\/\/summer-heart-0930.chufeiyun1688.workers.dev:443\/http\/ieeexplore.ieee.org\/document\/470331\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":3,"URL":"https:\/\/summer-heart-0930.chufeiyun1688.workers.dev:443\/https\/doi.org\/10.1109\/edtc.1995.470331","relation":{},"subject":[]}}