{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:27:48Z","timestamp":1725434868080},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,6]]},"DOI":"10.1109\/smacd.2016.7520744","type":"proceedings-article","created":{"date-parts":[[2016,8,5]],"date-time":"2016-08-05T13:40:44Z","timestamp":1470404444000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A novel energy-efficient self-correcting methodology employing INWE"],"prefix":"10.1109","author":[{"given":"Chaudhry Indra","family":"Kumar","sequence":"first","affiliation":[]},{"given":"Arvind","family":"Sharma","sequence":"additional","affiliation":[]},{"given":"Sandeep","family":"Miryala","sequence":"additional","affiliation":[]},{"given":"Anand","family":"Bulusu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007164"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2012.6177103"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/256474"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007148"},{"key":"ref2","first-page":"1149","article-title":"Near-Threshold Voltage (NTV) design opportunities and challenges","author":"kaul","year":"2012","journal-title":"IEEE DAC"},{"key":"ref9","first-page":"397","article-title":"Impact of STI-induced stress, inverse narrow width effect, and statistical Vth, variations on leakage currents in 120 nm CMOS","author":"pacha","year":"2004","journal-title":"IEEE ESSDERC"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2009.2035453"}],"event":{"name":"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","start":{"date-parts":[[2016,6,27]]},"location":"Lisbon, Portugal","end":{"date-parts":[[2016,6,30]]}},"container-title":["2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)"],"original-title":[],"link":[{"URL":"https:\/\/summer-heart-0930.chufeiyun1688.workers.dev:443\/http\/xplorestaging.ieee.org\/ielx7\/7513177\/7520642\/07520744.pdf?arnumber=7520744","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T15:26:14Z","timestamp":1475162774000},"score":1,"resource":{"primary":{"URL":"https:\/\/summer-heart-0930.chufeiyun1688.workers.dev:443\/http\/ieeexplore.ieee.org\/document\/7520744\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,6]]},"references-count":9,"URL":"https:\/\/summer-heart-0930.chufeiyun1688.workers.dev:443\/https\/doi.org\/10.1109\/smacd.2016.7520744","relation":{},"subject":[],"published":{"date-parts":[[2016,6]]}}}