On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method.

Mon, 01 Jan 2007 00:00:00 +0100

Ashesh Rastogi, Wei Chen, Sandip Kundu:
On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method. DAC 2007: 712-715