An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects.

Fri, 01 Jan 2010 00:00:00 +0100

Alodeep Sanyal, Ashesh Rastogi, Wei Chen, Sandip Kundu:
An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects. IEEE Trans. Computers 59(7): 922-932 (2010)