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Stephen F. Gilmartin

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2000 – 2009

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2005
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Khalil Arshak, Stephen F. Gilmartin, Damian Collins, Olga Korostynska, Arous Arshak:
Patterning Nanometer Resist Features on Planar and Topography Substrates Using The 2-Step NERIME FIB Top Surface Imaging Process. ICMENS 2005: 159-166

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