Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training.

Mon, 01 Jan 2024 00:00:00 +0100

Chang-Yeh Hsieh, Ling-Shen Tseng , Yi-Han Chen , Chiung-Hui Tsai , Chih-Hung Wu :
Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training. IEEE Access 12: 190598-190610 (2024)