BibTeX record conf/ats/HigamiFSKT11

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@inproceedings{DBLP:conf/ats/HigamiFSKT11,
  author       = {Yoshinobu Higami and
                  Hiroshi Furutani and
                  Takao Sakai and
                  Shuichi Kameyama and
                  Hiroshi Takahashi},
  title        = {Test Pattern Selection for Defect-Aware Test},
  booktitle    = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
                  Delhi, India, November 20-23, 2011},
  pages        = {102--107},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ATS.2011.24},
  doi          = {10.1109/ATS.2011.24},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HigamiFSKT11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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