"IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale ..."

Meng Lu et al. (2003)

> Home

Details and statistics

DOI: 10.1109/DFTVS.2003.1250091

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-05

- view
  authority control:
- export record
  dblp key:
  - conf/dft/LuSQT03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/LuSQT03
Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer:
IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. DFT 2003: 18-25

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.