"Robustness study of 1700 V 45 mΩ SiC MOSFETs."

Quentin Molin et al. (2018)

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DOI: 10.1109/ICIT.2018.8352285

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-11

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Quentin Molin, Mehdi Kanoun, Christophe Raynaud, Hervé Morel:
Robustness study of 1700 V 45 mΩ SiC MOSFETs. ICIT 2018: 830-834

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