David Roberts Todd M. Austin David T. Blaauw Trevor N. Mudge Krisztián Flautner Error Analysis for the Support of Robust Voltage Scaling. 65-70 2005 conf/isqed/2005 ISQED https://doi.org/10.1109/ISQED.2005.53 https://doi.ieeecomputersociety.org/10.1109/ISQED.2005.53 db/conf/isqed/isqed2005.html#RobertsABMF05