Tong-Yu Hsieh Melvin A. Breuer Murali Annavaram Sandeep K. Gupta 0001 Kuen-Jong Lee Tolerance of performance degrading faults for effective yield improvement. 1-10 2009 ITC https://doi.org/10.1109/TEST.2009.5355594 https://doi.ieeecomputersociety.org/10.1109/TEST.2009.5355594 conf/itc/2009 db/conf/itc/itc2009.html#HsiehBAGL09