<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/smc/HattoriOFN21" mdate="2024-10-06">
<author>Reiko Hattori</author>
<author>Yuya Ota</author>
<author>Toru Fujii</author>
<author orcid="0000-0002-7274-3490">Hiroshi Nakajima</author>
<title>Anomaly Ranking of Failure Causes in Manufacturing Process Using Causal Model.</title>
<pages>34-39</pages>
<year>2021</year>
<booktitle>SMC</booktitle>
<ee>https://doi.org/10.1109/SMC52423.2021.9659060</ee>
<crossref>conf/smc/2021</crossref>
<url>db/conf/smc/smc2021.html#HattoriOFN21</url>
</inproceedings>
</dblp>
