Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits.

Josep Altet Diego Mateo Eduardo Aldrete-Vidrio Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. 135 2010 IOLTS https://doi.org/10.1109/IOLTS.2010.5560220 https://doi.ieeecomputersociety.org/10.1109/IOLTS.2010.5560220 conf/iolts/2010 db/conf/iolts/iolts2010.html#AltetMA10