"Surface Defect System for Long Product Manufacturing Using Differential ..."

Francisco J. delaCalle Herrero, Daniel F. García, Rubén Usamentiaga (2020)

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DOI: 10.3390/S20072142

access: open

type: Journal Article

metadata version: 2025-12-15

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Francisco J. delaCalle Herrero, Daniel F. García, Rubén Usamentiaga:
Surface Defect System for Long Product Manufacturing Using Differential Topographic Images. Sensors 20(7): 2142 (2020)

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