NANOCHEMISTRY & APPLICATIONS
CHAPTER 1-7:
Dr. Nguyen Van Dung
Faculty of Chemical Engineering. Ho Chi Minh City University of Technology (HCMUT)
Email: [email protected]
Dr. Nguyen Van Dung. Faculty of Chemical Engineering. HCMUT
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X-RAY
✓ X-rays were first observed by Röntgen in 1895.
✓ Röntgen himself took pictures of the bones of the hand, and X-rays were
quickly used in medicine.
✓ In 1912, von Laue et al. demonstrated the wave nature of X-rays through
X-ray diffraction on copper sulfate crystals and also demonstrated that in
the crystal, the atoms are arranged in a spatial lattice.
Wilhelm Conrad Rontgen (1845-1923)
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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X-RAY
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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X-RAY
Band Wavelength Interaction
Gamma < 1 pm Nucleus
X-ray 1 nm - 1 pm Inner electrons
UV 400 nm - 1 nm Outer electrons
VIS 750 nm - 400 nm Outer electrons
Near IR 2.5 m - 750 nm Molecular vibrations
IR 25 m - 2.5 m Molecular vibrations
Microwave 1 mm - 25 m Molecular rotation
Radio > 1 mm Nuclear spins
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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X-RAY
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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X-RAY
X-rays are produced by the movement of electrons in the inner layer.
The conversion efficiency into X-rays
is very low (only about 0.8%); most
of the energy generated by impact
is converted into heat.
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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DIFFRACTION
Diffraction is a phenomenon observed when waves propagate through a
small gap or the edge of an obstacle (most clearly with obstacles whose
size is equivalent to the wavelength), in which the wave is deflected and
spreads in all directions from the obstacle position and self-interferes with
other waves spreading from the obstacle.
Diffraction is observed with all types of waves, such as sound, water
waves, electromagnetic waves (such as X-ray or radio waves), or particles
that exhibit wave properties through wave-particle duality.
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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BRAGG'S LAW
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BRAGG'S LAW
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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BRAGG'S LAW
2θ deviation
Beam 1
Beam 2
d
▪ Path difference between beams 1 & 2 = 2d.sin
▪ Diffraction conditions: n = 2d.sin
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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BRAGG'S LAW
Based on the Bragg formula 2dsin = n, the following
methods can be used:
Keep the incident angle, change wavelength
+ Laue method
Keep wavelength, change incident angle
+ Rotating-crystal diffraction
+ Debye-Schrerrer method (Powder method)
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LAUE METHOD
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LAUE METHOD
Crystal
X-ray beam
Laue diffraction image of Si in the [0 0 1] direction
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ROTATING-CRYSTAL DIFFRACTION
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POWDER METHOD
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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POWDER METHOD
Diffracted beam
Diffracted beam
Incident beam
Incident beam
Single crystal
Polycrystal
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X-RAY DIFFRACTOMETER
Detector
Monochrome
filter
Crystal
Monochrome
filter
X-ray beam
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XRD INSTRUMENT
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XRD INSTRUMENT
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XRD OF SiC
a.u.
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XRD OF AMORPHOUS MATERIALS
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INFORMATION FROM XRD RESULTS
Position of diffraction peaks (2)
+ Gives information about the elements of translational
symmetry, which means determining the shape and size of the
unit cell
+ Determine the names of minerals, materials, compounds,
and phases (compare with standard XRD)
Intensity of diffraction peaks
+ Calculate the electron density inside the lattice cell, which
means determining the position of the atoms in the lattice cell
Peak shape and width
+ Provide information about defects in the crystal
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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INTENSITIES OF X-RAY DIFFRACTION
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INTENSITIES OF X-RAY DIFFRACTION
The diffraction intensity is
significantly affected by
the arrangement of
atoms within the unit cell.
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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INTENSITIES OF X-RAY DIFFRACTION
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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STANDARD XRD PATTERNS
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STANDARD XRD PATTERNS
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STANDARD XRD PATTERNS
35-0734 Wavelength = 1.54056 Å
SrTiO3 2 Int hkl
Strontium Titanium Oxide 22.873 12 100
Tausonite, syn 32.424 100 110
Rad.: CuKa1 : 1.5405 Filter: Ni Beta 39.984 30 111
Ref: Swanson, H., Fuyat, Natl. Bur. Stand. (U.S.), Circ. 539, 3, 44, (1954). 46.483 50 200
52.357 3 210
System: Cubic S.G.: Pm m (221) 57.794 40 211
a: 3.9050 Å b: c: 67.803 25 220
a: b: g: 72.543 1 300
77.175 15 310
Pattern taken at 25 ˚C. Sample from Nat. Lead Co. 81.721 5 311
Spectrographic analysis: <0.01% Al, Ba, Ca, Si; <0.001% Cu, Mg. 86.204 8 222
Perovskite SuperGroup, 1C Group. PSC: cP5. To replace 5-634 95.127 16 321
and 40-1500.
Mwt: 183.52. Volume [CD]: 59.55
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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XRD OF TiO2
Measured XRD pattern of TiO2 mixture and its phases analysis
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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XRD OF KAOLIN
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XRD OF QUARTZ
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CALCULATION FOR CUBIC STRUCTURE
n = 2d hkl sin Cu Ka ( = 1.54 Å) on d110 = 2.22 Å
d hkl
=2 sin n sin Lattice plane
n 1 0.34 20.7º Level 1 (110)
= 2d nh nk nl sin
Level 2 (110)
2 0.69 43.9º
Or (220)
= 2d hkl sin d 220 =
a
d 220 1
8 =
a a d110 2
d hkl = d110 =
h +k +l
2 2 2
2
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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CALCULATION FOR CUBIC STRUCTURE
λ = 2dhkl sin θhkl
1/d = 2 sin θ/ λ
1/d2 = 4 sin2 θ/ λ2
• d values can be calculated from Miller indices (hkl)
1/d2 = (h2 + k2 + l2)/a2
• Combining these equations, we have the expression:
sin2 θ /(h2 + k2 + l2) = λ2 /4a2
• Thus, we must find the values h,k,l so that the ratio
sin2 θ/(h2 + k2 + l2) is constant.
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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SELECTION RULE
Structure Diffraction Non-diffraction
SC All No
BCC (h2+k2+l2) = Even (h2+k2+l2) = Odd
h, k, l are either all All h, k, l are not all odd
FCC
odd or all even or all even
Calculate h2 + k2 + l2 for each cubic structure
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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SELECTION RULE
Prohibited number SC FCC BCC hkl
1 100
2 2 110
3 3 111
4 4 4 200
5 210
6 6 211
7
8 8 8 220
9 221-300
10 10 310
11 11 311
12 12 12 222
13 320
14 14 321
15 -
16 16 16 400
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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XRD OF NaCl
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XRD OF NaCl
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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EXAMPLE
A material has a cubic structure with the following diffraction angles ():
9.30 13.26 16.32 19.01 21.27 23.41 25.44
The most intense diffraction peaks include the fourth peak (I/Io = 1), the
first peak (I/Io = 0.9), and the seventh peak (I/Io = 0.55).
Give Cu = 1.541Å,
a) Determine the cubic structure of this material
b) Calculate the lattice parameters of the material
c) Based on the standard data table, determine the material name
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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EXAMPLE
9.3 13.26 16.32 19.01 21.27 23.41 25.44
sin 0.162 0.229 0.281 0.326 0.363 0.397 0.430
sin2 0.026 0.053 0.079 0.106 0.132 0.158 0.185
dhkl 4.768 3.359 2.742 2.365 2.124 1.939 1.794
d2 22.732 11.284 7.518 5.595 4.511 3.761 3.217
TH1: SC 1 2 3 4 5 6 8
a2 22.73 22.568 22.555 22.381 22.556 22.565 25.738 const
TH2: BCC 2 4 6 8 10 12 14
a2 45.46 45.137 45.111 44.762 45.113 45.131 45.042 =const
TH1: FCC 3 4 8 11 12 16 19
a2 68.20 45.137 60.147 61.548 54.135 60.174 61.128 const
Vậy vật liệu này có cấu trúc bcc (lập phương tâm thể). Từ đó tính
được luôn thông số mạng a của vật liệu là a = 45.108 = 6.716Å
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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EXAMPLE
1 2 3 4 5 6 7
9.3 13.26 16.32 19.01 21.27 23.41 25.44
sin 0.162 0.229 0.281 0.326 0.363 0.397 0.430
sin2 0.026 0.053 0.079 0.106 0.132 0.158 0.185
dhkl 4.768 3.359 2.742 2.365 2.124 1.939 1.794
d values in the fourth (2.365; I/Io=1); first (4,768; I/Io=0.9) and
seventh (1,794; I/Io=0.55)
Check the standard data table for the value d = 2.365 and the
corresponding intensity ratios, obtaining:
2.365 (1) 4.77 (0.9) 1.794 (0.55) Brucite Mg(OH)2
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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EXAMPLE
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SCHERRER EQUATION
t (kích thước tinh thể) is the mean size of the ordered (crystalline) domains,
which may be smaller or equal to the grain size, which may be smaller or equal
to the particle size.
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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MICROPOROUS MATERIALS (ZSM-5 ZEOLITES)
https://pubs.rsc.org/en/content/articlelanding/2018/RA/C7RA11763A
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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MICROPOROUS MATERIALS (MOF-5 Zn4O(BDC)3)
https://pubs.acs.org/doi/10.1021/acsomega.8b02332
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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MICROPOROUS MATERIALS (OMS-2)
https://link.springer.com/article/10.1007/s10562-019-02828-1
https://pubs.acs.org/doi/10.1021/jp0300593
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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MESOPOROUS MATERIALS (MCM-41)
https://www.mdpi.com/2073-4344/9/7/606/htm
https://www.mdpi.com/1996-1944/11/5/779
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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MESOPOROUS MATERIALS (FDU-16)
SAXS patterns of FDU-
16 single crystals (A)
and FDU-15 (B)
https://pubs.rsc.org/en/content/articlelanding/2014/ta/c4ta00379a/unauth
https://www.researchgate.net/publication/275545331_Supplementary_Information_2007-JACS-
Mesoporous_carbon_single-crystals_from_organic-organic_self-assembly_SI
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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Ag/TiO2 NANOCOMPOSITE
https://link.springer.com/article/10.1007/s00339-017-1240-7
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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Fe3O4–Ag HYBRID NANOPARTICLES
https://doi.org/10.1166/jnn.2016.11029
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT
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CELLULOSE NANOCRYSTALS
Crystallinity index
(độ tinh thể)
IAM/I002 x 100%
https://doi.org/10.1590/1980-5373-MR-2019-0192
Dr. Nguyen Van Dung, Faculty of Chemical Engineering, HCMUT