"Characterizing Application Memory Error Vulnerability to Optimize ..."

Yixin Luo et al. (2014)

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DOI: 10.1109/DSN.2014.50

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yixin Luo, Sriram Govindan, Bikash Sharma, Mark Santaniello, Justin Meza, Aman Kansal, Jie Liu, Badriddine Khessib, Kushagra Vaid, Onur Mutlu:
Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory. DSN 2014: 467-478

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